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Scanning Electron Microscopy (SEM) Available by Concierge Request
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Scanning Electron Microscopy (SEM)
Scanning electron microscopy (SEM) services encompass techniques based on scanning electron microscopy. In SEM, an electron beam scans over the surface of the specimen in a raster pattern to build up the complete image. These electrons are collected and processed into an image of the surface of the sample. The resultant micrographs have great depth of field and level of detail of the exterior of the sample, as opposed to the detailed internal structure revealed by transmission electron microscopy (TEM). (Credit: Fraser Tan)
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