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Scanning Transmission Electron Microscopy (STEM)
Scanning transmission electron microscopy (STEM) combines the focused beam of electrons scanning in a raster pattern of SEM with the ultrathin sections typical of TEM. This allows for greater analysis of the sample by energy dispersive X-ray (EDX) spectroscopy, electron energy loss spectroscopy (EELS) and annular dark field imaging (ADF). In combination with a high-angle detector, STEM can produce atomic resolution images in which contrast directly correlates with atomic number.
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