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We found 5 results for Scanning Transmission Electron Microscopy (STEM)
For more results try searching for Scanning Transmission Electron Microscopy (STEM) across all experimental services.
Scanning transmission electron microscopy (STEM) combines the focused beam of electrons scanning in a raster pattern of SEM with the ultrathin sections typical of TEM. This allows for greater analysis of the sample by energy dispersive X-ray (EDX) spectroscopy, electron energy loss spectroscopy (EELS) and annular dark field imaging (ADF). In combination with a high-angle detector, STEM can produce atomic resolution images in which contrast directly correlates with atomic number.
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