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Orientation imaging microscopy (OIM) uses electron backscatter diffraction (EBSD) to determine the position of crystals in a material. In OIM, the EBSD, or backscatter Kikuchi diffraction (BKD), is determined by placing a polished, flat crystalline sample in a scanning electron microscope (SEM) chamber at a 70 degree angle. Electrons are released from an emission source and focused into a beam through the sample. The scattering pattern of the electrons is captured on film or a phosphor screen. A camera images the film or screen and creates an EBSD pattern. The pattern is compared to reference patterns of materials of known crystal structure to determine the orientation of the crystal lattice in the sample. OIM is useful in materials science research as well as analysis of crystallized biological samples. (Credit: Brooke Anderson-White)
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