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For low vacuum scanning electron microscopy (LVSEM), the scanning chamber is not pulled to a complete vacuum; residual pressure remains in the chamber. This helps combat imaging artefacts created by charge buildup on non-coated specimens, making it useful for examining more delicate non-coatable samples (similar to but not as high pressure as environmental/”wet” SEM). This technique is also known as variable pressure SEM. (Credit: Fraser Tan)
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