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Physical Electronics Inc.

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Chanhassen, Minnesota, US

About Physical Electronics Inc.

Physical Electronics (PHI), the premier name in surface analysis offers analytical services using our state-of-the-art instruments. Our scientists have a deep knowledge of surface analysis applications and problem solving, and the benefit of always having access to the latest instrument technology. It is a winning combination to help you tackle your most challenging production, R&D, and engineering issues. Common Applications: • Coatings • Nanomaterials and Thin Films • Material Failure and Process Control • Surface Defects and Contamination • Competitive Analysis • Biomaterials and Pharmaceutical • Materials Engineering

Our Services (6)


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X-ray Photoelectron Spectrometry

Price on request

• PHI Quantera and VersaProbe III scanning XPS microprobe systems with spectroscopic spatial resolution < 10 um
• Quantification and chemical state analysis
• Argon ion sputter depth profiling
• Also available: C60 ion and argon gas cluster ion (GCIB) sputter depth profiling

• Analysis cost based on hourly rate
• Project-based and high volume consideration available
• Sample analysis pre-planning and results review with lab scientist included


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Auger Electron Spectroscopy

Price on request

• PHI 710 field emission auger system with analytical spatial resolution < 8 nm
• Surface sensitive compositional analysis
• Ion sputter depth profiling
• In-situ fracture

• Analysis cost based on hourly rate
• Project-based and high volume consideration available
• Sample analysis pre-planning and results review with lab scientist included


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TOF-SIMS

Time of flight secondary ion mass spectrometry
Price on request

• PHI nanoTOF II TOF-SIMS system with spatial resolution analysis < 70nm
• Molecular imaging and trace analysis
• Argon ion and oxygen ion depth profiling
• Argon gas cluster ion beam (GCIB) depth profiling
• Also available: Focused Ion Beam (FIB) cross-sectioning, tandem mass (MS/MS) analysis, and sample heating/cooling

• Analysis cost based on per sample fixed rate
• Project-based and high volume consideration available
• Sample analysis pre-planning and results review with lab scientist included


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Spectroscopy

Price on request
Request a quote for more information about this service.

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Mass Spectrometry

Price on request
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Imaging & Spectroscopy

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Saad Alnabulsi

Western Region Manager / Sales and Marketing

FileType/PDF Created with Sketch. 3D Characterization of a PS-P2VP Block Copolymer 2012.pdf

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FileType/PDF Created with Sketch. 3D FIB-TOF Imaging of a SOFC 2013.pdf

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FileType/PDF Created with Sketch. 3D FIB-TOF Imaging the Microstructure of an Alloy.pdf

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FileType/PDF Created with Sketch. 3D Imaging of a Pharmaceutical Coating Using TOF-SIMS.pdf

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FileType/PDF Created with Sketch. Additive Identification using MS MS.pdf

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FileType/PDF Created with Sketch. Auger Analysis of Boron Oxide Crystals Formed by CBN CVD.pdf

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FileType/PDF Created with Sketch. C60 Polymer Additive Migration.pdf

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FileType/PDF Created with Sketch. Characterizing Electrically Isolated Bond Pads with the PHI 700Xi.pdf

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FileType/PDF Created with Sketch. Characterizing Nanoscale Precipitates in Steel.pdf

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FileType/PDF Created with Sketch. Chemical Imaging with PHI XPS Microprobes.pdf

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FileType/PDF Created with Sketch. Depth Profiling Graded OLEDs with Ar GCIB.pdf

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FileType/PDF Created with Sketch. Determining Solder Ball Surface Chemistry.pdf

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FileType/PDF Created with Sketch. Fracture Analysis of an Embrittled Low Alloy Steel Rotor Blade from an Operating Steam Turbine.pdf

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FileType/PDF Created with Sketch. High Energy Resolution Auger Depth Profiling of Zn Metal Surfaces.pdf

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FileType/PDF Created with Sketch. High Spatial Resolution and High Energy Resolution Auger Depth Profiling of NiSi Films.pdf

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FileType/PDF Created with Sketch. HR2 Molecular Imaging of Organic Droplet Defects 2013.pdf

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FileType/PDF Created with Sketch. Identifying Organic Defects.pdf

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FileType/PDF Created with Sketch. Identifying Stains on Packaging Materials.pdf

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FileType/PDF Created with Sketch. Imaging of Eu Oxidation States in a Doped Phosphor 2012.pdf

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FileType/PDF Created with Sketch. Imaging the Phase Segregation in PS PMMA Copolymer Blends 2012.pdf

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FileType/PDF Created with Sketch. Molecular Imaging of Micron Scale Features.pdf

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FileType/PDF Created with Sketch. Mosaic Imaging of Frozen-Hydrated Lenses 2012.pdf

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FileType/PDF Created with Sketch. PET Oligomer ID with MS MS.pdf

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FileType/PDF Created with Sketch. Relative Quantification of a Transition Metal Dopant 2012.pdf

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FileType/PDF Created with Sketch. Segregation of Impurities in Ductile Iron.pdf

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FileType/PDF Created with Sketch. TiN Composition Measurements by AES.pdf

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FileType/PDF Created with Sketch. TOF SIMS Analysis of Organic LED FILMS.pdf

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FileType/PDF Created with Sketch. TOF SIMS Analysis of the Glass Phase in AZS Materials.pdf

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FileType/PDF Created with Sketch. TOF SIMS Imaging of a Micropatterned Biological Ligand.pdf

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FileType/PDF Created with Sketch. TOF SIMS of Multi-Layer Paint Coatings.pdf

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FileType/PDF Created with Sketch. TOF-SIMS Imaging of a Drug Pellet 2010.pdf

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FileType/PDF Created with Sketch. TOFSIMS Chemical Imaging Metal Interconnects on a Flexible Organic Substrate 2012.pdf

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FileType/PDF Created with Sketch. TOFSIMS Imaging of High Mass Oligomers on Marine Aerosol Particles 2012.pdf

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FileType/PDF Created with Sketch. XPS Profiling of Organic PV Films.pdf

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