1339570132000

Nonlinear Electronics Research Facility (CNERF)

North Ryde, New South Wales, AU

CNERF is a facility for investigating nonlinear electronic circuit techniques that operates in close collaboration with international research partners and industry. Investigations probe the nature of distortion generation in electronic communications circuits. Circuit design techniques and component characterization for circuit simulation are feature results that emphasize practical application.

Although the research emphasis is microwave devices and circuits for communication systems, the techniques and phenomena occur in a wide range of applications, from audio to optical and digital circuits.

CNERF develops tools for designing microwave transistor circuits with optimal performance. Device-circuit interaction directs this work to produce models implemented in a manner that predicts distortion in any circuit configuration. Techniques to extract and verify models are used to measure device and circuit... Show more »

CNERF is a facility for investigating nonlinear electronic circuit techniques that operates in close collaboration with international research partners and industry. Investigations probe the nature of distortion generation in electronic communications circuits. Circuit design techniques and component characterization for circuit simulation are feature results that emphasize practical application.

Although the research emphasis is microwave devices and circuits for communication systems, the techniques and phenomena occur in a wide range of applications, from audio to optical and digital circuits.

CNERF develops tools for designing microwave transistor circuits with optimal performance. Device-circuit interaction directs this work to produce models implemented in a manner that predicts distortion in any circuit configuration. Techniques to extract and verify models are used to measure device and circuit characteristics. The combination of correct model implementation, an understanding of distortion generation, and correct measurement of device characteristics is essential to the development of accurate MESFET and HEMT models. This is work that enjoys proven success in the commercial sector.

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Pulsed Characterization
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arbitrary pulsed semiconductor parameter analyser system (APSPA)

arbitrary pulsed semiconductor parameter analyser system (APSPA)

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Rate Dependent Distortion
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Equipment
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Computer Science, Software Development, and IT Services
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Engineering and Fabrication
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Electronics
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Electrical Testing and Characterization Services
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