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Nanoscience Technologies LLC

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About Nanoscience Technologies LLC

At Nanoscience Technologies we connect the dots between device design, fabrication, characterization and failure analysis all under one roof with competitive cost. We will develop, implement and integrate ideas tailored according to the complexity and time constraints of our clients. Our approach is to offer flexible service that can provide either access to single or multiple process steps with the ambition of reinventing how nanotechnology can order experiments, analyze, and inspire their peers to act.  

Our Services (21)



Price on request

We offer wide range R&D proof of concept to feasibility studies to low volume prototyping projects in semiconductor, MEMS, Optoelectronics and Microfluidics.

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Mask Design and Mask Making

  • Mask Layout Designs, Design checks, Layout correction and Synthesis
  • Laser mask writer with 5um resolution 


  • E-beam lithography with 30 nm end to end resolution
  • Contact Aligner with 5 um resolution. Front and Back alignment
  • Thick and Thin photo resist process development

Thin Film Deposition

  • E-beam evaporation
  • Dual DC/RF magnetron sputtering
  • Physical Vapor Deposition PVD
  • RF Sputter
  • Atomic Layer Deposition ALD

Furnace Anneal, Oxidation and RTP

  • Dry oxidation, Wet oxidation
  • Ambient annealing
  • Rapid Thermal Anneals RTP
  • POCL3 and BBr3 Diffusion and Anneals

LPCVD, PECVD and ALD process 

  • Low Pressure Chemical Vapor Deposition
  • PE-TEOS CVD deposition, BPSG deposition
  • Low Temperature Oxides CVD, MOCVD
  • Plasma Enhanced CVD depositions
  • CCP-PEEVD max 450 C depositions
  • ICP-PECVD min 40 C depositions
  • Plasma Atomic Layer deposition
  • Thermal ALD depositions

Dry Plasma Etch

  • Reactive Ion Etchers RIE
  • Deep Reactive Ion Etch DRIE
  • Ion Mill
  • Asher and O2 Descum

Wet Etch Processing

  • RCA and HF Cleans
  • Wet Etch chemistry
  • Resist strips, Metal Etch, Solvent stations
  • TMAH and KOH Etchants 

Wafer Bonding, Sawing and Polishing

  • EV wafer bonder, Fusion bonder
  • Flip chip bonder
  • Wafer saw and Dicer
  • CMP , Backgrind , Micromill


Microfluidic Device Design and Fabrication

Price on request

We are an innovation-driven company with expertise in creating solutions for biotechnology by merging the latest advances in nanotechnology and microfluidics. We offer micro & nano fabrication and lab on chip services using UV photolithography, casting in PDMS and PMMA.

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Lab on Chip PDMS and PMMA Stamps

  • Design and simulation of desired microfluidics chip
  • Reverse engineering from scientific literature and needs for your research strategy.
  • Mask design and Mask fabrication
  • SU8 Deep trench molds and high aspect ratio sidewalls.
  • PDMS and PMMA Micro channels fabricated from soft lithography from SU8 photo patterning on Silicon wafer.
  • O2 Plasma surface treatment
  • PDMS and PMMA chips be ready by bonding on glass.

Silicon based Nano Microfluidic Device

  • Silicon Based microfluidic chips and Bio sensors and liquid movement via valves, pumps, heaters
  • Si integration to test board
  • Si Nano Bio device prototyping
  • Silicon fabrication based  on Microfluidic channel modelling and simulation for flow dynamics
  • Surface contact angle analysis and design
  • Direct Laser Lithography
  • Bio sensors and Microfluidics arrays and their integration to PCB circuitry and interconnects
  • Nano Needles and Nano drug delivery fabrication. 


Materials Science

Price on request

We combine our knowledge and resources to help you find the best material characterization solutions, while helping you to save time and cost.
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Nano Material Characterization

  • XRD-XRF X-ray Diffraction and Fluorescence
  • XPS X-Ray Photoelectron Spectroscopy
  • AES Auger Electron Spectroscopy
  • TEM Transmission Electron Microscopy
  • SEM Scanning Electron Microscopy

Nano Chemical Material Analysis

  • FTIR Fourier Infrared spectroscopy
  • UV-VIS UV Spectroscopy
  • NMR Nuclear Magnetic Resonance
  • Raman Spectroscopy
  • Zeta Potential

Nano Solid-State Physics

  • AFM Atomic Force Microscopy
  • LDV Laser Doppler Vibrometer
  • Hall Mobility
  • Ellipsometer and Spectroscopy
  • Semiconductor Parameter Analyzer


Electrical Testing and Characterization Services

Price on request

Understanding the device fundamentals that drives the development of new devices, we bring specialized talent in semiconductor physics, Optics and Device analysis.

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Electrical Characterization & Device Measurements

  • Curve tracer, Semiconductor parameter analyzer
  • DC Probe station test bench
  • Mercury Probe station
  • RF Probe station test bench
  • CV Impedance Characterization
  • Hall mobility
  • Solar PV Lifetime tester


Failure Analysis

Price on request

Our staff are ready to help you determine the root cause, so that the solutions can be developed quickly, preventing further failures and reducing downtime racing your goals. 

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Failure Analysis and Root cause studies

  • Material failure analysis
  • Scanning Electron Microscope
  • Transmission Electron Microscope
  • Focused Ion Beam
  • Device parameter analysis
  • Scanning Acoustic Microscope
  • PCB Reverse Engineering
  • IV, CV Curve tracer measurement
  • RF Device engineering


Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy services
Starting at $40.00 per sample

Instrument : Carl Zeiss Ultra FE-SEM

Resolution : 1nm at 15 KV

Specs :

  • Ultra high resolution imaging at low kV
  • Fully integrated EDS detector for compositional information
  • CL Detector for Cathodoluminescence

Applications :

  1. Failure analysis and Reverse engineering
  2. Grain size, Sample cross sections, Surface morphology, Defect studies


Atomic Force Microscopy (AFM) Services

Starting at $115.00 per sample

Instrument:  Park Systems XE100 AFM
Resolution: XY stage travel range 150 mm (200 mm optional)
Z stage travel range is 25 mm Scan range is up to 30 um  
Precision surface morphology analysis with contact, non contact and tapping mode.

Lateral Force Microscopy LFM
Magnetic Force Microscopy MFM
Kelvin Probe Microscopy KPM
Scanning Spreading Resistance SSRM
Scanning Tunneling Microscopy STM
Conductive Force Microscopy CAFM


  1. Surface RMS roughness, Step Height and Surface morphology
  2. Surface potential, Work function extraction
  3. Young's modulus, Electric and magnetic surface domain mapping


Transmission Electron Microscopy (TEM)

Transmission Electron Microscopy services
Price on request

Instrument:  FEI Titan Themis 3 series
Resolution:  Ultra-bright XFEG Gun, 60–300 kV beam-sensitive samples

  • Lorenz mode for magnetic properties
  • Super X-quad EDS detector
  • HRTEM and STEM mode
  • HAADF and triple dark field-bright field detectors
  • Selected Area Electron Diffraction SAED studies


  1. Surface SAED, HRTEM Elemental analysis
  2. Cross section failure analysis and dislocation defect studies
  3. Analytical material science studies of grain boundary voids and stacking faults
  4. Crystalline defect studies and elemental mapping


Zeta Potential Measurements

Price on request

Instrument: Zeta PALS BH
Resolution: Particle size 1nm to 100um, Zeta potential -220 mV to +220 mV

  • Sample mobility rage 10^-11to 10^-7 m2/v
  • Sample concentration 10 % v/V
  • Sample Volume 180 ul, 600 ul, 1250 ul
  • Sample conductivity 300 s/m


  1. Determination of stability in colloidal dispersion
  2. Quantitative analysis of electrophoretic mobility and Dynamic mobility
  3. Chemical fingerprinting in polymer and glass


X-Ray Diffraction (XRD)

Price on request

Instrument: Rigaku SmartLAB
Resolution: 4-Circle Diffractometer HR XRD, Pilatus 2-D detector  
Tool Specs:

  • Rocking curve, Reciprocal space substrate mapping In-Plane HR XRD
  • X-ray topography mapping
  • Pole figure orientation measurements


  1. Rocking curve analysis
  2. Phase composition and residual strain measurements
  3. Texture orientation measurements
  4. Phase composition, Lattice parameters and alloy composition investigations


Raman Spectroscopy

Price on request

Instrument: LabRAM HR
Resolution: Visible Raman with 325nm and 514nm laser source
Tool Specs:

  • Visible range with CCD multi window
  • Near IR (NIR) with GaAs detector ( 800nm to 1600nm)
  • Lower temperature limits and analysis up to 7K


  1. Photo luminescence spectroscopy
  2. Raman resonance, Raman surface enhancement IR-PL mapping
  3. Chemical fingerprinting on polymer, ceramic and glass substrates
  4. Vibration frequency measurements


X-ray Photoelectron Spectrometry

Price on request

Instrument : Axis Ultra XPS
Resolution : Spot size 15 microns, depth resolution 10A to 100A
Specs :

  • High energy resolution and charge neutralization features
  • Ultra fast parallel imaging
  • Quantitative chemical mapping

Applications :

  1. Surface analysis and Chemical mapping of all elements except for H and He
  2. Depth profiling and Elemental composition



Fourier transform infrared spectroscopy
Price on request

Instrument:  FTIR Perkin Elmer
Resolution: KBr beam splitter with spectral range 7800 to 380 cm^-1
Tool Specs:

  • Infrared absorption spectral resolution 0.5 to 64 cm^-1
  • Repeatability wavelength of +/-0.02 cm at 1,600 cm
  • TGS, Liquid N2 cooled MCT detectors
  • Supporting Extensions: UATR, Diffusive reflectance, Transmittance and TG-IR


  1. Identification of complex mixtures of materials, gasses, thick films, liquids, and solid polymers
  2. Surface analysis of adhesives, coatings and polymer adhesion
  3. Material identification and fingerprinting.


Focused Ion Beam Tomography

Price on request

Instrument: Helios NanoLAB FEI
Resolution: 1 nm @ 15 kV, 1.6 nm @ 5 kV, Electron beam resolution. 2.5 nm at 30 kV Ion beam resolution.
Tool Specs:

  • TEM sample lamella preparation
  • Sample size up to 150 mm diameter with full rotation max clearance of 55 mm
  • Platinum, Tungsten and Carbon deposition


  1. Circuit Edits
  2. APEX cuts, Micro manipulator cross section
  3. Device reverse engineering
  4. Structure cuts and Tomography 


UV-VIS Spectroscopy

Price on request

Instrument:  Shimadzu MPC3 series  
Resolution: UV-VIS-NIR with 200 nm to 3200 nm UV to NIR spectra range  
Tool Specs:

  • PMT, InGaAs, PdS detector support integration
  • Absolute specular reflectance, diffuse reflectance modes
  • Temperature range 5 C to 45 C
  • Greater than 0.2 mL liquid samples


  1. Absorption, transmission studies on solid and thin film substrates
  2. Optical investigation properties of liquids and solids b/n 200 nm to 3300 nm spectra range


Device Testing

Price on request

Curve Tracer and Device Parameter Probe Bench

  • CV Impedance Test and Analysis
  • CV Impedance Dissipation factor on passive components
  • Mobile ion studies, SiOx and SiNx layer integrity
  • Determine breakdown voltages and IV's
  • Measurement of resistance, Capacitance, Carrier Recombination, Metal Insulator Metal profiles

Semiconductor Parameter Analyzer Probe Station

  • Variable temperature
  • 0.1fA | 0.5 uV measurement resolution
  • CV sweeps 1KHz – 5 MHz
  • Probe tips 10 um
  • Probe stations includes microscope/video system, vibration isolation table, probe card holders
  • RF and SMU DC probes needles calibration software and standards
  • Measurements of IV, Id-Vd, Id-Vg, Break down, Carrier Recombination
  • Reliability life time, Pulsed Id-Vd.
  • Determining Mobility and Threshold Voltage in CMOS, RF MMIC and Memory devices
  • Test and pad structure design to extract Threshold Voltages, Body effect, Transconductance, Channel doping simulation.

RF Probe Station Test Bench

  • Frequency Range : 9 kHz to 70 GHz
  • Impedance : 50 ohm or 75 ohm
  • Loss Parameter : 94 dB with 0.006 dB trace noise
  • RF probe station for the research of advanced active and passive components
  • Stage comes with zoom microscope with 20X and 50 X magnification, LED ring Illuminator, precision x-y stage with RF probe tips
  • Determine Time -Domain -Gating mode, Pulsed RF, Return Loss, Impedance, Insertion Loss
  • Measurement and failure analysis Transmission Coefficient
  • Frequency conversion, S-Parameter, Antenna, Smith chart and signal integrity measurements


Device Characterization

Price on request

Solid state physics services 

  • Hall Mobility, MPMS, SQUID measurements
  • Hall Voltage,Carrier Concentration, Coefficient and Carrier mobility
  • Low Temperature Liquid N2 and He Superconducting pulse measurement and analysis
  • Probe Size :10 um to 3 um. 5 Probes DC Supply
  • Liquid N2 : 77 Kelvin to 400 Kelvin
  • Liquid He : 5 Kelvin to 500 Kelvin

Solar PV Lifetime & Efficiency services

  • Determine Isc, Jsc, Short Circuit Current Isc, Sun Voc
  • Open Circuit Voltage Voc slope, Shunt resistance Rs measurements 
  • Measurement and result analysis of Maximum Power Pmax ( Vmax and Imax)
  • Investigation of FF, Fill Factor conversion efficiency, IQE, EQE, n-efficiency conversion
  • Sample Size : 100m to 156 mm Si and pseudo squares.


Printed Circuit Assemblies/Boards (PCA/PCB)

Price on request

Instrument:  Scanning Acoustic Microscope SAM KSI v4.0  
Resolution: Transducer at 100 MHz, 230 MHz and 400 MHz

  • Scanning modes in A, B, C, D, 3D, Sequence, Auto Profile and X-scan
  • HQ, FFT, B-Scan measurements
  • Max scan area 400 x 400 mm


  1. Failure Analysis on PCB for interfacial de-lamination, inter connect joints, die bonding, aseal analysis and void detection
  2. PCB anomalies, Encapsulated IC packages
  3. PCB reverse engineering, wafer bonding, PCB lamination and Ceramic packaging
  4. Interconnect via metal investigation


Laser Doppler Vibrometry

Price on request

Instrument:  Micro System Analyzer 5 Series
Resolution:  Frequency range 0 to 20 MHz, 2nm in-plane resolution  

  • Ultra-density sample grids with 512 X user specified measurement points
  • In-Plane motion detection up to 1MHz
  • Rapid 3D topography non-contact measurement with nano meter resolution 


  1. Static and Dynamic characterization of MEMS devices
  2. Frequency domain resonance analysis
  3. Time domain and damping studies on 3D MEMS structures 


Optical Metrology

Price on request

In-Line Metrology Services

  • Atomic Force Microscope AFM
  • Spectroscopic Ellipsometer
  • Resistivity mapping
  • Profilometer, Stress tester, Particle counters and Optical microscope


MEMS Characterization

Price on request
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Sam Farah

Process Engineer
  • Positive review for Nanofabrication:

    April 2021

    "Very responsive, knowledgeable in Nano fabrication process, great pricing, high quality work and timeline was well respected. We would definitely work with Nanoscience Technologies in future and would recommend to our contacts without hesitation. "

Nanoscience Technologies LLC has not received any endorsements.