MicroVision Laboratories, Inc. has been providing businesses, consultants and other testing laboratories with expert microscopy and analytical services since 2003.
Our client base covers a broad spectrum of industries including semi-conductors, aerospace, electronics, biomedical, ceramics, optics, pharmaceuticals, mineralogy, metallurgy, thin films, environmental, membranes filtration and industrial hygiene.
We partner with companies in all phases of product development and sales, including R&D, manufacturing, QC, advertising and failure analysis. Our laboratory offers a highly-trained and experienced staff utilizing a powerful set of analytical tools (SEM with light element EDS detector, Bruker X-Flash elemental mapping, Robinson backscatter detector, Real Time X-Ray Imaging, PLM, Micro-FTIR, Vickers Micro Hardness Testing, light microscopy, cross sectioning/precision polishing and wet chemistry).
MicroVision Labs is owned and operated by a career microscopist, John Knowles, who understands the needs of our clients. Our emphasis on helping our clients solve problems, not just providing data, sets us apart from other labs. We have the technology and knowledge to find answers to your most difficult challenges, helping you succeed at every step.
Standard shipping requests:
Please include a chain of custody with your samples including clear instructions as to what analyses you would like preformed or what your problem is.
Micro x-ray fluorescence (µXRF or MXRF) is an elemental analysis technique similar to energy dispersive x-ray spectroscopy (EDS). But unlike EDS, which uses a beam of electrons to generate x-rays from the sample, µXRF uses a focused beam of x-rays. This allows for much lower detection limits than EDS, down in the ppm range. The spatial resolution of µXRF can go down to 25 microns. Since the samples do not require any special preparation, no conductive coating needed, setup for this analysis is fast and non-destructive. Elemental maps and determining multi layer film thickness are two very common applications. Micro x-ray fluorescence has been used in applications such as forensics, small feature evaluations, elemental mapping, mineralogy, electronics, multi-layered coating analysis, micro-contamination detection, film and plating thickness, biology and environment.
MicroVision Labs has three fully-operational SEMs, Bruker X-Flash EDS detectors and mapping technology, backscatter electron (BSE) imaging, variable pressure and large chamber capabilities, providing a full suite of microscopy services for all of your analytical needs.
Analysis is performed only on areas which are exposed to the electron beam, facilitating precise control of the analyzed area. This means the composition of very small areas or particles in a sample can be taken. Since EDS is performed in the SEM chamber, a quick and easy interrogation of the surface materials as viewed on the SEM is possible. This can be expanded to include the entire sample, please see our Elemental Mapping page. Additionally, relative amount of the elements present can be calculated, generating composition percentages.
MicroVision Labs uses a brand new comprehensive LUMOS micro-IR of standard optical and polarized light microscopy combined with sophisticated automation for a variety of IR spectral measurement techniques. Our LUMOS system is the first of its kind to be commissioned in the US and allows for particles down to 5um in diameter to be examined. This new instrument increases our ability to provide quality organic spectroscopy and enables sample mapping using special IR features with full automation for feature identification with quantifiable, traceable spectral measurement.
Advantages of Micro-FTIR:
Real time 2-dimentsional x-ray imaging is an extremely powerful method for inspecting industrial samples. This non-destructive imaging technique allows us to look through the packaging of a wide variety of samples (e.g. integrated circuits, electronic devices, medical implants, cables, etc.) and image the denser components within. This is particularly useful for failure analysis (locating wire breaks in cables, shorts, defects, etc.), quality control (comparing samples to CAD drawing or each other), R&D (examining the internal architecture of a competitor’s product, verifying manufacturing steps and new vendors).
Our cabinet system has a motorized stage that can receive and manipulate large samples (e.g. ~20 in. by 20 in., ~3 ft. by 8 in.) in the X and Y axes. Smaller samples can also be tilted and rotated on axis allowing for live adjustments of the sample until the desired view is shown. When fully zoomed out images can be taken covering an area on the sample of ~ 2 inches wide by 2 inches. When fully zoomed in 15um bond wires can easily be resolved.
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