MicroVision Laboratories, Inc.

MicroVision Labs has three fully-operational SEMs, Bruker X-Flash EDS detectors and mapping technology, backscatter electron (BSE) imaging, variable pressure and large chamber capabilities, providing a full suite of microscopy services for all of your analytical needs.

Advantages:
- Extremely high magnifications possible (750,000x+)
- Fine resolution of small features (5-6 nm resolution)
- Low magnification overview of large objects possible (10mm+)
- Gradations visible in even similar material layers possible at low acceleration voltage
- Preparation and examination of a wide range of materials
- Detection of materials of varying density possible with BSE imaging

Application Fields:
- Materials Science
- Manufacturing
- Environmental Testing
- Semi-conductors
- Filtration Technology
- Metallurgy and Ceramics
- Paint and Surface Coatings
- Plastics
- Medical Devices and Pharmaceuticals
- Nanotechnology

Analysis is performed only on areas which are exposed to the electron beam, facilitating precise control of the analyzed area. This means the composition of very small areas or particles in a sample can be taken. Since EDS is performed in the SEM chamber, a quick and easy interrogation of the surface materials as viewed on the SEM is possible. This can be expanded to include the entire sample, please see our Elemental Mapping page. Additionally, relative amount of the elements present can be calculated, generating composition percentages.

Advantages:
- Spectral information can be gathered from areas as small as 1 cubic micron
- All elements analyzed simultaneously from beryllium (Be) on up the periodic table
- Relative concentrations in weight, oxide, or atomic formula percentages can be obtained from the - - EDS spectra
- State of the art detectors, used here at MicroVision Labs, allow for rapid analysis and compositional analysis in less than a minute
- Full data sets are indexed, allowing for additional data analysis
- Multiple data points, line profiles, or regions can be compared in a single imaged area

Application Fields:
- Environmental Testing
- Materials Identification
- Electronics
- Ceramics and Filtration
- Metallography
- Construction and Manufacturing
- Home Inspection
- Indoor Air Quality (IAQ)
- Pharmaceuticals and Medical Devices
- Forensics

MicroVision Labs uses a brand new comprehensive LUMOS micro-IR of standard optical and polarized light microscopy combined with sophisticated automation for a variety of IR spectral measurement techniques. Our LUMOS system is the first of its kind to be commissioned in the US and allows for particles down to 5um in diameter to be examined. This new instrument increases our ability to provide quality organic spectroscopy and enables sample mapping using special IR features with full automation for feature identification with quantifiable, traceable spectral measurement.

Advantages of Micro-FTIR:
- Identification of a wide range of materials, including solids, powders, films, and liquids.
- Individual phases can be directly identified with chemical preparation.
- Ideal for detailed comparative analysis, including identification of contaminants.
- Composites and mixtures analyzed to determine compounded material properties.
- Small samples or inclusions can be examined with micro-FTIR attachment, allowing for particles or fibers as small as ~5 um to be examined.
- ATR surface sampling allows isolation and examination of coatings or contaminants limited to ~10 um depth from surface.
- Qualitative identification of materials, or quantitative analysis using customized methods are possible.

Application Fields:
- Polymer Manufacturing
- Environmental Testing
- Materials Science
- Fabric and Textiles
- Surface Coatings and Paints
- Thick/thin Film Electronics
- Materials Identification
- Manufacturing and Process Technology
- Pharmaceuticals
- Failure analysis

Real time 2-dimentsional x-ray imaging is an extremely powerful method for inspecting industrial samples. This non-destructive imaging technique allows us to look through the packaging of a wide variety of samples (e.g. integrated circuits, electronic devices, medical implants, cables, etc.) and image the denser components within. This is particularly useful for failure analysis (locating wire breaks in cables, shorts, defects, etc.), quality control (comparing samples to CAD drawing or each other), R&D (examining the internal architecture of a competitor’s product, verifying manufacturing steps and new vendors).
Our cabinet system has a motorized stage that can receive and manipulate large samples (e.g. ~20 in. by 20 in., ~3 ft. by 8 in.) in the X and Y axes. Smaller samples can also be tilted and rotated on axis allowing for live adjustments of the sample until the desired view is shown. When fully zoomed out images can be taken covering an area on the sample of ~ 2 inches wide by 2 inches. When fully zoomed in 15um bond wires can easily be resolved.