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MicroVision Laboratories, Inc.

Chelmsford, Massachusetts, US

MicroVision Laboratories, Inc. has been providing businesses, consultants and other testing laboratories with expert microscopy and analytical services since 2003.

Our client base covers a broad spectrum of industries including semi-conductors, aerospace, electronics, biomedical, ceramics, optics, pharmaceuticals, mineralogy, metallurgy, thin films, environmental, membranes filtration and industrial hygiene.

We partner with companies in all phases of product development and sales, including R&D, manufacturing, QC, advertising and failure analysis. Our laboratory offers a highly-trained and experienced staff utilizing a powerful set of analytical tools (SEM with light element EDS detector, Bruker X-Flash elemental mapping, Robinson backscatter detector, Real Time X-Ray Imaging, PLM, Micro-FTIR, Vickers Micro Hardness Testing, light microscopy, cross sectioning/precision polishing and wet chemistry).... Show more »

MicroVision Laboratories, Inc. has been providing businesses, consultants and other testing laboratories with expert microscopy and analytical services since 2003.

Our client base covers a broad spectrum of industries including semi-conductors, aerospace, electronics, biomedical, ceramics, optics, pharmaceuticals, mineralogy, metallurgy, thin films, environmental, membranes filtration and industrial hygiene.

We partner with companies in all phases of product development and sales, including R&D, manufacturing, QC, advertising and failure analysis. Our laboratory offers a highly-trained and experienced staff utilizing a powerful set of analytical tools (SEM with light element EDS detector, Bruker X-Flash elemental mapping, Robinson backscatter detector, Real Time X-Ray Imaging, PLM, Micro-FTIR, Vickers Micro Hardness Testing, light microscopy, cross sectioning/precision polishing and wet chemistry).

MicroVision Labs is owned and operated by a career microscopist, John Knowles, who understands the needs of our clients. Our emphasis on helping our clients solve problems, not just providing data, sets us apart from other labs. We have the technology and knowledge to find answers to your most difficult challenges, helping you succeed at every step.

Publications:
- Advances in Holographic Replication with the Aztec Structure by James J. Cowan
- Reactive ion etching of motheye and photonic crystal silicon nanostructures using CBrF3 (SPIE paper #6002-49) by G.J. Sonek, V.G. Kreismanis

Standard shipping requests:
Please include a chain of custody with your samples including clear instructions as to what analyses you would like preformed or what your problem is.

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MXRF
Microbeam X-Ray Fluorescence
Starting at $300.00 per hour

Micro x-ray fluorescence (µXRF or MXRF) is an elemental analysis technique similar to energy dispersive x-ray spectroscopy (EDS). But unlike EDS, which uses a beam of electrons to generate x-rays from the sample, µXRF uses a focused beam of x-rays. This allows for much lower detection limits than EDS, down in the ppm range. ... Show more »

Micro x-ray fluorescence (µXRF or MXRF) is an elemental analysis technique similar to energy dispersive x-ray spectroscopy (EDS). But unlike EDS, which uses a beam of electrons to generate x-rays from the sample, µXRF uses a focused beam of x-rays. This allows for much lower detection limits than EDS, down in the ppm range. The spatial resolution of µXRF can go down to 25 microns. Since the samples do not require any special preparation, no conductive coating needed, setup for this analysis is fast and non-destructive. Elemental maps and determining multi layer film thickness are two very common applications. Micro x-ray fluorescence has been used in applications such as forensics, small feature evaluations, elemental mapping, mineralogy, electronics, multi-layered coating analysis, micro-contamination detection, film and plating thickness, biology and environment.

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Scanning Electron Microscopy (SEM)
Scanning Electron Microscopy services
Price on request

MicroVision Labs has three fully-operational SEMs, Bruker X-Flash EDS detectors and mapping technology, backscatter electron (BSE) imaging, variable pressure and large chamber capabilities, providing a full suite of microscopy services for all of your analytical needs.

Advantages:
- Extremely high magnifications possible... Show more »

MicroVision Labs has three fully-operational SEMs, Bruker X-Flash EDS detectors and mapping technology, backscatter electron (BSE) imaging, variable pressure and large chamber capabilities, providing a full suite of microscopy services for all of your analytical needs.

Advantages:
- Extremely high magnifications possible (750,000x+)
- Fine resolution of small features (5-6 nm resolution)
- Low magnification overview of large objects possible (10mm+)
- Gradations visible in even similar material layers possible at low acceleration voltage
- Preparation and examination of a wide range of materials
- Detection of materials of varying density possible with BSE imaging

Application Fields:
- Materials Science
- Manufacturing
- Environmental Testing
- Semi-conductors
- Filtration Technology
- Metallurgy and Ceramics
- Paint and Surface Coatings
- Plastics
- Medical Devices and Pharmaceuticals
- Nanotechnology

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Scanning electron microscopy
microscopy
Energy Dispersive Spectroscopy
Price on request

Analysis is performed only on areas which are exposed to the electron beam, facilitating precise control of the analyzed area. This means the composition of very small areas or particles in a sample can be taken. Since EDS is performed in the SEM chamber, a quick and easy interrogation of the surface materials as viewed on the SEM... Show more »

Analysis is performed only on areas which are exposed to the electron beam, facilitating precise control of the analyzed area. This means the composition of very small areas or particles in a sample can be taken. Since EDS is performed in the SEM chamber, a quick and easy interrogation of the surface materials as viewed on the SEM is possible. This can be expanded to include the entire sample, please see our Elemental Mapping page. Additionally, relative amount of the elements present can be calculated, generating composition percentages.

Advantages:
- Spectral information can be gathered from areas as small as 1 cubic micron
- All elements analyzed simultaneously from beryllium (Be) on up the periodic table
- Relative concentrations in weight, oxide, or atomic formula percentages can be obtained from the - - EDS spectra
- State of the art detectors, used here at MicroVision Labs, allow for rapid analysis and compositional analysis in less than a minute
- Full data sets are indexed, allowing for additional data analysis
- Multiple data points, line profiles, or regions can be compared in a single imaged area

Application Fields:
- Environmental Testing
- Materials Identification
- Electronics
- Ceramics and Filtration
- Metallography
- Construction and Manufacturing
- Home Inspection
- Indoor Air Quality (IAQ)
- Pharmaceuticals and Medical Devices
- Forensics

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Scanning electron microscopy
FT-IR
Fourier transform infrared spectroscopy
Price on request

MicroVision Labs uses a brand new comprehensive LUMOS micro-IR of standard optical and polarized light microscopy combined with sophisticated automation for a variety of IR spectral measurement techniques. Our LUMOS system is the first of its kind to be commissioned in the US and allows for particles down to 5um in diameter to be... Show more »

MicroVision Labs uses a brand new comprehensive LUMOS micro-IR of standard optical and polarized light microscopy combined with sophisticated automation for a variety of IR spectral measurement techniques. Our LUMOS system is the first of its kind to be commissioned in the US and allows for particles down to 5um in diameter to be examined. This new instrument increases our ability to provide quality organic spectroscopy and enables sample mapping using special IR features with full automation for feature identification with quantifiable, traceable spectral measurement.

Advantages of Micro-FTIR:
- Identification of a wide range of materials, including solids, powders, films, and liquids.
- Individual phases can be directly identified with chemical preparation.
- Ideal for detailed comparative analysis, including identification of contaminants.
- Composites and mixtures analyzed to determine compounded material properties.
- Small samples or inclusions can be examined with micro-FTIR attachment, allowing for particles or fibers as small as ~5 um to be examined.
- ATR surface sampling allows isolation and examination of coatings or contaminants limited to ~10 um depth from surface.
- Qualitative identification of materials, or quantitative analysis using customized methods are possible.

Application Fields:
- Polymer Manufacturing
- Environmental Testing
- Materials Science
- Fabric and Textiles
- Surface Coatings and Paints
- Thick/thin Film Electronics
- Materials Identification
- Manufacturing and Process Technology
- Pharmaceuticals
- Failure analysis

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Industrial X-Ray Imaging
Price on request

Real time 2-dimentsional x-ray imaging is an extremely powerful method for inspecting industrial samples. This non-destructive imaging technique allows us to look through the packaging of a wide variety of samples (e.g. integrated circuits, electronic devices, medical implants, cables, etc.) and image the denser components... Show more »

Real time 2-dimentsional x-ray imaging is an extremely powerful method for inspecting industrial samples. This non-destructive imaging technique allows us to look through the packaging of a wide variety of samples (e.g. integrated circuits, electronic devices, medical implants, cables, etc.) and image the denser components within. This is particularly useful for failure analysis (locating wire breaks in cables, shorts, defects, etc.), quality control (comparing samples to CAD drawing or each other), R&D (examining the internal architecture of a competitor’s product, verifying manufacturing steps and new vendors).
Our cabinet system has a motorized stage that can receive and manipulate large samples (e.g. ~20 in. by 20 in., ~3 ft. by 8 in.) in the X and Y axes. Smaller samples can also be tilted and rotated on axis allowing for live adjustments of the sample until the desired view is shown. When fully zoomed out images can be taken covering an area on the sample of ~ 2 inches wide by 2 inches. When fully zoomed in 15um bond wires can easily be resolved.

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x-ray imaging
Electron Microscopy
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Spectroscopy
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Microscopy
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Imaging & Spectroscopy
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Infrared spectroscopy services
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Radiography
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2018-04-27 12:34:22 -0700

Net Promoter Score of 9 received for Scanning Electron Microscopy (SEM).

Additional Ratings: satisfaction with deliverable: 10, satisfaction with timeliness: 9.
2018-03-27 09:13:24 -0700

Net Promoter Score of 10 received for FT-IR.

Additional Ratings: satisfaction with deliverable: 10, satisfaction with timeliness: 10.
2017-10-16 07:10:10 -0700

Net Promoter Score of 10 received for FT-IR.

Additional Ratings: satisfaction with deliverable: 10, satisfaction with timeliness: 10.
2016-12-09 10:59:21 -0800

Net Promoter Score of 8 received for Scanning Electron Microscopy (SEM).

Additional Ratings: satisfaction with deliverable: 10, satisfaction with timeliness: 10.

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