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Microstructural Analysis Unit

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Ultimo, New South Wales, AU

About Microstructural Analysis Unit

The MAU is comprised of five separate characterisation nodes;

Electron microscopy and microanalysis
Scanning probe microscopy
X-ray characterisation
Electrical measurement and characterisation
Optical characterisation
As well as a materials fabrication and processing equipment suite. This research... Show more »

The MAU is comprised of five separate characterisation nodes;

Electron microscopy and microanalysis
Scanning probe microscopy
X-ray characterisation
Electrical measurement and characterisation
Optical characterisation
As well as a materials fabrication and processing equipment suite. This research infrastructure is supported by an academic Director, a Research Laboratory Manager and three highly experienced and highly skilled Professional Officers.

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Our Services (17)


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Atomic Force Microscopy (AFM) Services

Price on request

Scanning probe microscopes (SPM):
Digital Instruments Dimension™ 3100 AFM and Bioscope
Digital Instruments Multimode SPM
Nanosurf Easyscan E-STM

Scanning probe microscopes (SPM):
Digital Instruments Dimension™ 3100 AFM and Bioscope
Digital Instruments Multimode SPM
Nanosurf Easyscan E-STM

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Fluorescence Spectrophotometry

Price on request

Varian Cary Eclipse Fluorescence Spectrometer

Perkin Elmer LS50 Luminescence Spectrometer

Varian Cary Eclipse Fluorescence Spectrometer

Perkin Elmer LS50 Luminescence Spectrometer

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Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy services
Price on request

Scanning electron microscopes (SEM):
Zeiss Supra 55VP SEM with RAITH E-beam Lithography System & EBSD
FEI XL30 ESEM
FEI Quanta 200 ESEM with Cathodoluminescence (CL) Spectroscopy and Moran Scientific CL Mapping System
JEOL 35CF SEM with Moran Scientific Dual Detector EDS X-ray Mapping System
FEI Nova NanoSEM

SEM Accessories:
Kleindiek Nanomanipulators

Scanning electron microscopes (SEM):
Zeiss Supra 55VP SEM with RAITH E-beam Lithography System & EBSD
FEI XL30 ESEM
FEI Quanta 200 ESEM with Cathodoluminescence (CL) Spectroscopy and Moran Scientific CL Mapping System
JEOL 35CF SEM with Moran Scientific Dual Detector EDS X-ray Mapping System
FEI Nova NanoSEM

SEM Accessories:
Kleindiek Nanomanipulators

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Surface Coating

Price on request

Thin film coating chambers:
Edwards EO6 Deposition System
Denton DV502 Turbo Deposition System
Dynavac CE12-14s Evaporation System
Shannon E-beam Evaporation System

Thin film coating chambers:
Edwards EO6 Deposition System
Denton DV502 Turbo Deposition System
Dynavac CE12-14s Evaporation System
Shannon E-beam Evaporation System

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UV-VIS Spectroscopy

Price on request

Perkin Elmer Lambda 950 UV/VIS/NIR Spectrometer

Varian Cary 5E UV/VIS/NIR Spectrometer

Ocean Optics SD2000 Diode Array Spectrometer

Perkin Elmer Lambda 950 UV/VIS/NIR Spectrometer

Varian Cary 5E UV/VIS/NIR Spectrometer

Ocean Optics SD2000 Diode Array Spectrometer

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X-Ray Diffraction

Price on request

X-ray diffraction (XRD):
Siemens D5000 Diffractometer

X-ray diffraction (XRD):
Siemens D5000 Diffractometer

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Material Testing Services

Price on request
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Electron Microscopy

Price on request
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Spectroscopy

Price on request
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Analytical Chemistry Services

Price on request
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Chemistry and Materials

Price on request
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Imaging & Spectroscopy

Price on request
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Microscopy

Price on request
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Scanning Probe Microscopy

Price on request
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Engineering and Fabrication

Price on request
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Spectrophotometry

Price on request
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Fabrication and Materials Processing Services

Price on request
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