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Microstructural Analysis Unit

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Ultimo, New South Wales, AU

About Microstructural Analysis Unit

The MAU is comprised of five separate characterisation nodes;

Electron microscopy and microanalysis
Scanning probe microscopy
X-ray characterisation
Optical characterisation

Our Services (13)


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Atomic Force Microscopy (AFM) Services

Price on request

Scanning probe microscopes (SPM):
Digital Instruments Dimension™ 3100 AFM and Bioscope
Digital Instruments Multimode SPM
Nanosurf Easyscan E-STM

Scanning probe microscopes (SPM):
Digital Instruments Dimension™ 3100 AFM and Bioscope
Digital Instruments Multimode SPM
Nanosurf Easyscan E-STM

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Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy services
Price on request

Scanning electron microscopes (SEM):
Zeiss Supra 55 FE-SEM
Zeiss EVO LS15 SEM with extended pressure and Bruker XFlash SDD EDS Detector

Scanning electron microscopes (SEM):
Zeiss Supra 55 FE-SEM
Zeiss EVO LS15 SEM with extended pressure and Bruker XFlash SDD EDS Detector

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Surface Coating

Price on request

Thin film coating chambers:
Edwards EO6 Deposition System
Dynavac CE12-14s Evaporation System
Shannon E-beam Evaporation System

Thin film coating chambers:
Edwards EO6 Deposition System
Dynavac CE12-14s Evaporation System
Shannon E-beam Evaporation System

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UV-VIS Spectroscopy

Price on request

Perkin Elmer Lambda 950 UV/VIS/NIR Spectrometer

Agilent Cary 7000 UMS UV-VIS-NIR

Perkin Elmer Lambda 950 UV/VIS/NIR Spectrometer

Agilent Cary 7000 UMS UV-VIS-NIR

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X-Ray Diffraction (XRD)

Price on request

X-ray diffraction (XRD):
Bruker D8 Discover

X-ray diffraction (XRD):
Bruker D8 Discover

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Electron Microscopy

Price on request
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Spectroscopy

Price on request
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Chemistry and Materials

Price on request
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Imaging & Spectroscopy

Price on request
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Microscopy

Price on request
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Scanning Probe Microscopy

Price on request
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Spectrophotometry

Price on request
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Fabrication and Materials Processing Services

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