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Impulse Technology, LLC

State College, Pennsylvania, US

Impulse Technology specializes in fabrication of nanoscale patterned thin film specimens, and comprehensive composition-microstructure-properties(mechanical, thermal, electrical, and optical ) characterization of materials at the micro-nano scales.

Whether you are an academic or industry researcher characterizing challenging thin film materials (10 nm - 100 microns), we can help. If you can put your material on a wafer, we can fabricate the specimens for mechanical, thermal, electrical testing to go with your existing tools, or we can provide the complete characterization service.

If you need MEMS design and/or nanofabrication services, we have the experience and infrastructure to offer value that you will appreciate.

Impulse Technology, LLC has not listed any services.

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Tensile Testing
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Nanoscale Analysis and Characterization
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Our strength is in coupling experiments in micro and nanoscale materials. Examples are simultaneous mechanical and electrical stressing effects in dielectric breakdown; magnetic field effects on mechanical or electrical properties; thermal field effects on physical properties. If you have a unique study in mind, please contact us... Show more »

Our strength is in coupling experiments in micro and nanoscale materials. Examples are simultaneous mechanical and electrical stressing effects in dielectric breakdown; magnetic field effects on mechanical or electrical properties; thermal field effects on physical properties. If you have a unique study in mind, please contact us with a tentative description of your specimen needs (thin film material, specimen dimension and desired characterization, which will guide us to offer a custom product quote.

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Nanomaterial Electron Microscopy Analysis
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Want to do your experiments inside a transmission/scanning electron microscope? We can miniaturize your experimental setup size to give you the capability. Virtually all forms of microscopy is allowable. Please contact us with your experimental details for a custom quote.

Want to do your experiments inside a transmission/scanning electron microscope? We can miniaturize your experimental setup size to give you the capability. Virtually all forms of microscopy is allowable. Please contact us with your experimental details for a custom quote.

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Specimen Preparation for Nanoscale Characterization
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If you wish to do your own experiments, but want to avoid specimen preparation, we are here to help. The specimens can be freestanding (clamped at the ends resembling a bridge) or attached to a substrate. There is no restriction on the type of thin film material and the film thickness. There is also no need to change your... Show more »

If you wish to do your own experiments, but want to avoid specimen preparation, we are here to help. The specimens can be freestanding (clamped at the ends resembling a bridge) or attached to a substrate. There is no restriction on the type of thin film material and the film thickness. There is also no need to change your characterization tool. For example, if you do nanoindentation, you may wish to procure a bridge type specimen and use your nanoindenter to measure tensile properties to get rid of any substrate effect. The same is true for thermal conductivity measurements.
Depending on the experimental goals, the customer has a variety of options of nanofabricated test setup. The overall setup size typically is 5 mm x 10 mm

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Thermal Conductivity Analysis
Starting at $200.00 per sample

From few atomic layers to a few microns, or from polymers to diamond like films, we can accurately measure thermal conductivity of thin films. We use both steady state and transient techniques. We make freestanding specimens, so the value you get is free from substrate effects. Please contact us with a tentative description of... Show more »

From few atomic layers to a few microns, or from polymers to diamond like films, we can accurately measure thermal conductivity of thin films. We use both steady state and transient techniques. We make freestanding specimens, so the value you get is free from substrate effects. Please contact us with a tentative description of your specimen needs (thin film material, specimen dimension and desired characterization), which will guide us to offer a custom product quote. The pricing given below is for micron and thicker specimen and only an estimate.

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Thin Film Electrical Characterization
Price on request

We can measure electrical conductivity, band-gap and mobility of thin films. Please contact us with a brief description of your material for a product quote

We can measure electrical conductivity, band-gap and mobility of thin films. Please contact us with a brief description of your material for a product quote

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Thin Film Mechanical Characterization
Starting at $250.00 per sample

We measure uniaxial tensile stress-strain in thin films. Specimens can be 10 nm to 10 microns. Specimens are made freestanding to eliminate substrate effects. Minimal constraints over material type or thickness.

We measure uniaxial tensile stress-strain in thin films. Specimens can be 10 nm to 10 microns. Specimens are made freestanding to eliminate substrate effects. Minimal constraints over material type or thickness.

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Physical Analysis Methods
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Strength Analysis
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Strength Analysis Services

Strength Analysis Services

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Thermal Analysis Services
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Chemistry and Materials
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Material Characterization Services
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Thin Film Analysis
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Engineering
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Analytical Chemistry Services
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July 19, 2016

Positive review received for Thin Film Mechanical Characterization:

"Our experience with Impulse Technology, LLC was satisfactory. Although the duration of the required tests took longer than originally quoted/expected, Dr. Haque and Dr. Nahar were very forthcoming with any new information and took the time politely explain the details with regard to any adjustments to anticipated deliverables. They also answered our many questions promptly and completely. We greatly appreciate the time and effort put into our request and would definitely consider using their services again."

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