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EAG Laboratories

11 Orders Completed
Sunnyvale, California, US

About EAG Laboratories

Founded: 1978 Type: Privately Held Size: 501-1000 employees

When it comes to understanding the physical structure, chemical properties and composition of materials, no scientific services company offers the breadth of experience, diversity of analytical techniques of technical ingenuity of EAG Laboratories. From polymers to composites, thin films to superalloys—we know... Show more »

When it comes to understanding the physical structure, chemical properties and composition of materials, no scientific services company offers the breadth of experience, diversity of analytical techniques of technical ingenuity of EAG Laboratories. From polymers to composites, thin films to superalloys—we know how to leverage materials sciences to gain a competitive edge. At EAG Laboratories, we don’t just perform testing, we drive commercial success—through thoughtfully designed investigations, technically superior analyses and expert interpretation of data.

EAG Laboratories is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG's expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your organization meet your goals.

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Certifications & Qualifications

AAALAC DEA Schedule II DEA Schedule III DEA Schedule IV DEA Schedule V FDA Inspected GLP IACUC OLAW USDA

Our Services (157)


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Impurity Analysis

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Basic Metabolic Panel

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Drug Delivery Systems

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Chemical Synthesis

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Photostability Studies

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Large Molecule Bioanalysis

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In vivo Pharmacology Studies

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Chemical Stability Testing

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Accelerated Stability Testing

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Wet Chemical Analysis

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Validation, Services

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Clinical Validation of Diagnosis

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UV-VIS Spectroscopy

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Trace Metal Analysis

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Toxicology

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Product Stability Testing

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Regulatory Affairs Consulting

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Raw Material Testing

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Radiotracers and Radiopharmaceuticals

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R&D Services

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Quality Assurance

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Recombinant Protein Expression

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Process and Scale-Up Chemistry

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Contract Services Directory

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Drug Preformulation

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In vivo Drug Efficacy Testing

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Preclinical Study Design

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ADME/DMPK Studies

Drug Metabolism and Pharmacokinetics
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Pharmacogenomics/Pharmacogenetics

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Particle Analysis and Characterization

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Parenteral Formulation Development

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Nonclinical Research

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Microbiology Testing

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In vitro Metabolic Stability Assays

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Medicinal Chemistry

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Clinical Trial Management

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Material Testing Services

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IND/NDA/BLA Submission

Investigational New Drug/New Drug Application Submission
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Animal Model in vivo Analyses

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In vivo Immunotoxicity Testing

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Immunobiology Services

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HPLC

High Performance Liquid Chromatography
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Pharmaceutical Formulation

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Forced Degradation Studies

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Feasibility Studies

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Extractable and Leachable Testing

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Environmental Testing

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Endotoxin Testing

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High Throughput Screening (HTS)

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Drug Discovery

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Drug Development

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Dosage Form Development

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Solubility and Dissolution Testing

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Contract Research

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Chemical Contaminant Analysis

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Package and Container Testing

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Process Consulting

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Materials Science

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Consulting

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Auger Electron Spectroscopy

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Auger Electron Spectroscopy (AES, Auger) is a surface-sensitive analytical technique that utilizes a high energy electron beam as an excitation source. Atoms that are excited by the electron beam can relax, leading to the emission of "Auger" electrons. The kinetic energies of the emitted Auger electrons are characteristic of... Show more »

Auger Electron Spectroscopy (AES, Auger) is a surface-sensitive analytical technique that utilizes a high energy electron beam as an excitation source. Atoms that are excited by the electron beam can relax, leading to the emission of "Auger" electrons. The kinetic energies of the emitted Auger electrons are characteristic of elements present within the top 5-10nm of the sample.
The electron beam can be scanned over a variably sized area, or it can be directly focused on a small surface feature of interest. This ability to focus the electron beam to diameters of 10-20nm makes Auger an extremely useful tool for elemental analysis of small surface features. When used in combination with ion sputter sources, Auger can perform compositional depth profiling.
EAG has unmatched experience handling both routine and non-routine Auger analysis requests and for many years, has applied Auger to many kinds of industrial investigation.
EAG's extensive Auger expertise has direct analytical benefits, whether we analyze sub-μm particles to determine contamination sources in wafer processing equipment or analyze defects in electronic devices to investigate the root cause of failures. Auger has extensive applications in metallurgical studies, including in the determination of oxide layer thickness of electro-polished medical devices, and EAG continually draws on experience to help address demanding problems.

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Chemistry, Manufacturing and Controls (CMC)

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Atomic Force Microscopy (AFM) Services

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Atomic Force Microscopy (AFM), provides images with atomic or near-atomic-resolution, surface topography, capable of quantifying surface roughness of samples down to the angstrom-scale. In addition to presenting a surface image, AFM can also provide quantitative measurements of feature sizes, such as step heights and other... Show more »

Atomic Force Microscopy (AFM), provides images with atomic or near-atomic-resolution, surface topography, capable of quantifying surface roughness of samples down to the angstrom-scale. In addition to presenting a surface image, AFM can also provide quantitative measurements of feature sizes, such as step heights and other dimensions. Additionally, magnetic force microscopy (MFM), which is a variation of AFM, is capable of mapping the magnetic domains of samples.
We also have the capability of analyzing wet samples and can provide SKPM (Scanning Kelvin Probe Microscopy) and a range of scanning probe electrical measurements including conductance, resistance and capacitance.

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Phase IV Clinical Trials

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FT-IR

Fourier transform infrared spectroscopy
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In Fourier Transform Infrared Spectroscopy (FTIR), a spectrum showing molecular vibrations is obtained, in order to identify or characterize organic materials such as polymers, lubricants, adhesives and cleaning agents. A limited number of inorganic compounds can also be evaluated using FTIR analysis.
At Evans Analytical Group,... Show more »

In Fourier Transform Infrared Spectroscopy (FTIR), a spectrum showing molecular vibrations is obtained, in order to identify or characterize organic materials such as polymers, lubricants, adhesives and cleaning agents. A limited number of inorganic compounds can also be evaluated using FTIR analysis.
At Evans Analytical Group, most FTIR analyses are carried out with a microscope FTIR with a minimum spot size of 15µm. This is ideal for the direct, in situ, analysis of organic contaminants on metallic surface such as bond pads or contacts. For the identification of contaminants on non-metallic surfaces such as on a lens or other optical component, or for the analysis of bulk organic materials, specialized sample preparation methods are utilized at EAG.
EAG's analytical scientists are highly experienced and are knowledgeable in the application of FTIR analyses to a wide variety of problems pertaining to organic materials or organic contaminants. Experience, fast turnaround, clear concise written reports, and person to person service are provided to help customers resolve their materials problems.

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Phase I Clinical Trials

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Gel Permeation Chromatography (GPC)

Gel Permeation Chromatography
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Gel Permeation Chromatography (GPC) or Size Exclusion Chromatography (SEC) is an analytical technique for the characterization of a wide variety of polymers or other macromolecules in a mixture. A solution of the dissolved sample is passed through a column packed with a controlled-porosity packing, typically a polymeric porous gel... Show more »

Gel Permeation Chromatography (GPC) or Size Exclusion Chromatography (SEC) is an analytical technique for the characterization of a wide variety of polymers or other macromolecules in a mixture. A solution of the dissolved sample is passed through a column packed with a controlled-porosity packing, typically a polymeric porous gel (typically referred to as the "stationary phase"). The size and shape of the molecule dictate its ability to interact with the pores of the stationary phase. Small molecules typically interact and enter with pores without difficulty and therefore take the longest to elute from the column. Molecules with a very large molecule weight cannot interact or move into the pore spaces available in the stationary phase and elute relatively quickly. In this manner, a whole range of molecular weights can be characterized when compared to the retention time of standard molecular weights, typically polystyrene reference standards.

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Gas Chromatography (GC)

Gas Chromatography
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GD-MS

Glow Discharge Mass Spectrometry
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Solid samples are analyzed using Glow Discharge Mass Spectrometry (GDMS) by exposing them to a gas discharge or plasma atomization / ionization source. Argon is typically used as the discharge gas. The sensitivity, ease of calibration, flexibility and the robustness to analyze a wide variety of sample types and matrices make GDMS... Show more »

Solid samples are analyzed using Glow Discharge Mass Spectrometry (GDMS) by exposing them to a gas discharge or plasma atomization / ionization source. Argon is typically used as the discharge gas. The sensitivity, ease of calibration, flexibility and the robustness to analyze a wide variety of sample types and matrices make GDMS an excellent choice for trace elemental analysis.
Evans Analytical Group is the industry leader for GDMS services, offering the best detection limits along with accurate mass fraction determinations in the broadest variety of solids, films and coatings. EAG's depth and breadth of experience and dedication to analytical method development in the GDMS field is unmatched, with the largest number of GDMS instruments and highly qualified scientists available to address your materials issues.

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ICP-MS

Inductively Coupled Plasma Mass Spectrometry
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Inductively Coupled Plasma (ICP) analytical techniques can quantitatively measure the elemental content of a material from the ppt to the wt% range. The only elements which cannot usually be measured by ICP methods are C, H, O, N and the halogens.
Solid samples are dissolved or digested in a liquid, usually an acidic aqueous... Show more »

Inductively Coupled Plasma (ICP) analytical techniques can quantitatively measure the elemental content of a material from the ppt to the wt% range. The only elements which cannot usually be measured by ICP methods are C, H, O, N and the halogens.
Solid samples are dissolved or digested in a liquid, usually an acidic aqueous solution.
The sample solution is then sprayed into the core of an inductively coupled argon plasma, which can reach temperatures of approximately 8000°C. At such high temperature, all analyte species are atomized, ionized and thermally excited, and they can then be detected and quantified with a mass spectrometer (MS).
ICP-MS (ICP-Mass Spec) measures the masses of the element ions generated by the high temperature argon plasma. The ions created in the plasma are separated by their mass to charge ratios, enabling the identification and quantitation of unknown materials. ICP-MS offers extremely high sensitivity (i.e. low detection limits) for a wide range of elements

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Combinatorial Chemistry

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ICP-AES/OES

Inductively Coupled Plasma Atomic Emission Spectroscopy/Optical Emission Spectroscopy
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Inductively Coupled Plasma (ICP) analytical techniques can quantitatively measure the elemental content of a material from the ppt to the wt% range. The only elements which cannot usually be measured by ICP methods are C, H, O, N and the halogens.
Solid samples are dissolved or digested in a liquid, usually an acidic aqueous... Show more »

Inductively Coupled Plasma (ICP) analytical techniques can quantitatively measure the elemental content of a material from the ppt to the wt% range. The only elements which cannot usually be measured by ICP methods are C, H, O, N and the halogens.
Solid samples are dissolved or digested in a liquid, usually an acidic aqueous solution.
The sample solution is then sprayed into the core of and inductively coupled argon plasma, which can reach temperatures of approximately 8000°C. At such high temperature, all analyte species are atomized, ionized and thermally excited, and they can then be detected and quantified with an optical emission spectrometer (OES).
ICP-OES measures the light emitted at element-specific characteristic wavelengths from thermally excited analyte ions . This light emitted is separated and measured in a spectrometer, yielding an intensity measurement that can be converted to an elemental concentration by comparison with calibration standards.

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Chemical Analysis

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Optical Profilometry

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Optical profilometry (OP) is a non-contact interferometric-based method for characterizing surface topography. A typical OP analysis provides 2D and 3D images of a surface, numerous roughness statistics, and feature dimensions. In addition to these standard measurements, we can also perform many advanced OP analyses with a... Show more »

Optical profilometry (OP) is a non-contact interferometric-based method for characterizing surface topography. A typical OP analysis provides 2D and 3D images of a surface, numerous roughness statistics, and feature dimensions. In addition to these standard measurements, we can also perform many advanced OP analyses with a state-of-the-art Bruker Contour GTX-8 3D optical microscope. These include:
•Analysis automation for high-throughput measurements of several hundred features on a single sample, such as patterned wafers or die features
•The instrument can be used to determine the thickness of transparent, continuous films.
OP is suitable for numerous applications and sample types because it can accommodate many sample geometries, a wide range of possible analysis dimensions and a versatile Z-range, covering a broad range of potential surface roughness. We are committed to working with our clients to develop unique approaches for characterizing the topographies of even the most challenging samples.

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Pyrolysis/Thermal Analysis

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Thermal Analysis (TGA, DTA and DSC) detects the inter-atomic and inter-/intra- molecular interactions as related to an imposed external change in temperature. It is essential for investigating physical properties of materials throughout their entire life cycle (R&D, production control and failure analysis).
•Thermogravimetric... Show more »

Thermal Analysis (TGA, DTA and DSC) detects the inter-atomic and inter-/intra- molecular interactions as related to an imposed external change in temperature. It is essential for investigating physical properties of materials throughout their entire life cycle (R&D, production control and failure analysis).
•Thermogravimetric Analysis (TGA) measures the mass change of a material as a function of temperature and time, in a controlled atmosphere. It is ideally used to assess volatile content, thermal stability, degradation characteristics, aging/lifetime breakdown, sintering behavior and reaction kinetics.
•Differential Scanning Calorimetry (DSC) measures the heat flow associated with phase transitions or reactions, such as melting, crystallization, solid phase transition, glass transition, curing, sorption, etc.. It is ideally used to determinine melting point, glass transition temperature, crystallinity, degree of curing, heat capacity, crystalline impurities, etc..
•Differential Thermal Analysis (DTA) measures the temperature difference of the sample versus a reference, caused by thermal events in a material. It provides similar information to DSC. DTA usually complements TGA with phase transition information.

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Calibration Services

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Raman Spectroscopy

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Raman Spectroscopy (Raman Analysis) enables you to determine the chemical structure of a sample and identify the compounds present by measuring molecular vibrations, similar to Fourier Transform Infrared Spectroscopy (FTIR). However, Raman yields better spatial resolution and enables the analysis of smaller areas.
Raman is a good... Show more »

Raman Spectroscopy (Raman Analysis) enables you to determine the chemical structure of a sample and identify the compounds present by measuring molecular vibrations, similar to Fourier Transform Infrared Spectroscopy (FTIR). However, Raman yields better spatial resolution and enables the analysis of smaller areas.
Raman is a good technique for the qualitative analysis of organic and/or inorganic mixed materials and can also be employed for semi-quantitative and quantitative analysis. It is often used to:
•Identify organic molecules, polymers, biomolecules, and inorganic compounds both in the bulk and in individual particles
•Raman imaging and depth profiling is used to map the distribution of components in mixtures, such as drugs in excipients, tablets, and drug-eluting stent coatings
•Determine the presence of different carbon types (diamond, graphitic, amorphous carbon, diamond-like carbon, nanotubes, etc.) and their relative proportions, something for which it is particularly well suited
•Determine inorganic oxides and their valence state
•Measure the stress and crystalline structure in semiconductor and other materials

We offers our customers Raman services to analyze small contamination areas, identify materials in small areas, and measure stress. The resulting data helps our clients resolve problems quickly, reduce cycle times, and improve production processes. We believe that no competing lab can match the skill set and experience of our staff. Plus, you can count on fast report delivery, accurate data, and person-to-person service, ensuring you understand the information that you receive.

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Rutherford Backscattering Spectrometry

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Rutherford Backscattering Spectrometry (RBS) is an ion scattering technique used for compositional thin film analysis. RBS is unique in that it allows quantification without the use of reference standards. During an RBS analysis, high-energy (MeV) He2+ ions (i.e. alpha particles) are directed onto the sample and the energy... Show more »

Rutherford Backscattering Spectrometry (RBS) is an ion scattering technique used for compositional thin film analysis. RBS is unique in that it allows quantification without the use of reference standards. During an RBS analysis, high-energy (MeV) He2+ ions (i.e. alpha particles) are directed onto the sample and the energy distribution and yield of the backscattered He2+ ions at a given angle is measured. Since the backscattering cross section for each element is known, it is possible to obtain a quantitative compositional depth profile from the RBS spectrum obtained, for films that are less than 1μm thick.
Evans Analytical Group has world-class experience in analyzing thin films using RBS, with both pelletron and tandetron instrumentation. EAG's experience in the analysis of all types of semiconductor thin films (oxides, nitrides, silicides, high and low-K dielectrics, metal films, compound semiconductors and dopants) enables fast turnaround times, accurate data, and high quality person-to-person service.

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Human Blood Collection Service

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Blending

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Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy services
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Scanning Electron Microscopy (SEM) provides high-resolution and long-depth-of-field images of the sample surface and near-surface. SEM is one of the most widely used analytical tools due to the extremely detailed images it can quickly provide. Coupled to an auxiliary Energy Dispersive X-ray Spectroscopy (EDS) detector, SEM also... Show more »

Scanning Electron Microscopy (SEM) provides high-resolution and long-depth-of-field images of the sample surface and near-surface. SEM is one of the most widely used analytical tools due to the extremely detailed images it can quickly provide. Coupled to an auxiliary Energy Dispersive X-ray Spectroscopy (EDS) detector, SEM also offers elemental identification of nearly the entire periodic table.
We use SEM analysis in cases where optical microscopy cannot provide sufficient image resolution or high enough magnification. Applications include failure analysis, dimensional analysis, process characterization, reverse engineering, and particle identification. EAG's Scanning Electron Microscopy expertise and range of experience is invaluable to the industries and customers we serve. Person-to-person service ensures good communication of the results and their implications. Customers can be present during the analysis, enabling an immediate sharing of data, imaging and information.

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Scanning Transmission Electron Microscopy (STEM)

Scanning transmission electron microscopy
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Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM) are closely related techniques that use an electron beam to image a sample. High energy electrons, incident on ultra-thin samples allow for image resolutions that are on the order of 1-2Å. Compared to SEM, TEM and STEM have better spatial... Show more »

Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM) are closely related techniques that use an electron beam to image a sample. High energy electrons, incident on ultra-thin samples allow for image resolutions that are on the order of 1-2Å. Compared to SEM, TEM and STEM have better spatial resolution and are capable of additional analytical measurements, but require significantly more sample preparation.
Although more time consuming than many other common analytical tools, the wealth of information available from TEM and STEM analyses is impressive. Not only can outstanding image resolution be obtained, it is also possible to characterize crystallographic phase, crystallographic orientation (by diffraction mode experiments), produce elemental maps (using EDS or EELS), and obtain images that highlight elemental contrast (dark field mode). These can all be done from nm sized areas that can be precisely located. STEM and TEM are the ultimate analysis tools for nanomaterials, thin films and IC samples.
EAG recently added an aberration corrected STEM instrument to provide the ultimate in commercially available atomic scale imaging.

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Biopharmaceutical Development

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Biomarker Discovery

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SIMS

Secondary Ion Mass Spectometry
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Secondary Ion Mass Spectrometry (SIMS) detects very low concentrations of dopants and impurities. It can provide elemental depth profiles over a depth range from a few angstroms (Å) to tens of microns (µm). The sample of interest is sputtered/etched with a beam of primary ions (usually O or Cs). Secondary ions formed during the... Show more »

Secondary Ion Mass Spectrometry (SIMS) detects very low concentrations of dopants and impurities. It can provide elemental depth profiles over a depth range from a few angstroms (Å) to tens of microns (µm). The sample of interest is sputtered/etched with a beam of primary ions (usually O or Cs). Secondary ions formed during the sputtering process are extracted and analyzed using a mass spectrometer (usually a quadrupole or magnetic sector). The secondary ions can range in concentration from matrix levels down to sub-ppm trace levels.
Evans Analytical Group is the industry standard for SIMS analysis, offering the best detection limits along with accurate concentration and layer structure identification. EAG's depth and breadth of experience and dedication to research and development in the SIMS field is unmatched. EAG has the largest range of SIMS instruments worldwide (more than 40), staffed by highly qualified scientists. EAG also has the world's largest reference material library of ion-implanted and bulk-doped standards for accurate SIMS quantification.
We are adept at understanding our client's needs and designing relevant analyses to most effectively address their concerns and interests. EAG regularly uses SIMS analysis to help customers across a range of industries with R&D, quality control, failure analysis, troubleshooting, and process monitoring. EAG provides person-to-person service throughout the process, to allow a full understanding of the test results.

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Transmission Electron Microscopy (TEM)

Transmission Electron Microscopy services
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Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM) are closely related techniques that use an electron beam to image a sample. High energy electrons, incident on ultra-thin samples allow for image resolutions that are on the order of 1-2Å. Compared to SEM, TEM and STEM have better spatial... Show more »

Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM) are closely related techniques that use an electron beam to image a sample. High energy electrons, incident on ultra-thin samples allow for image resolutions that are on the order of 1-2Å. Compared to SEM, TEM and STEM have better spatial resolution and are capable of additional analytical measurements, but require significantly more sample preparation.
Although more time consuming than many other common analytical tools, the wealth of information available from TEM and STEM analyses is impressive. Not only can outstanding image resolution be obtained, it is also possible to characterize crystallographic phase, crystallographic orientation (by diffraction mode experiments), produce elemental maps (using EDS or EELS), and obtain images that highlight elemental contrast (dark field mode). These can all be done from nm sized areas that can be precisely located. STEM and TEM are the ultimate analysis tools for nanomaterials, thin films and IC samples.

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Biological Testing

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TOF-SIMS

Time of flight secondary ion mass spectrometry
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Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface analytical technique that focuses a pulsed beam of primary ions onto a sample surface, producing secondary ions in a sputtering process. Analyzing these secondary ions provides information about the molecular and elemental species present on the surface. For... Show more »

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface analytical technique that focuses a pulsed beam of primary ions onto a sample surface, producing secondary ions in a sputtering process. Analyzing these secondary ions provides information about the molecular and elemental species present on the surface. For example, if there were organic contaminants, such as oils adsorbed on the surface, TOF-SIMS would reveal this information, whereas other techniques may not. Since TOF-SIMS is a survey technique, all the elements in the periodic table, including H, are detected. Moreover, TOF-SIMS analysis can provide mass spectral information; image information in the XY dimension across a sample; and also depth profile information in the Z dimension into a sample.
The surface sensitivity of TOF-SIMS makes it a good first pass at problem solving. Once you have an idea of what you are dealing with, you can then use other techniques to obtain additional information. We have been doing TOF-SIMS commercially longer than any other company; our expertise is second to none. This is particularly crucial for TOF-SIMS, where the data sets can be extremely complex and may require more interpretation or data processing than other analytical techniques.
The imaging capabilities of TOF-SIMS can provide elemental and molecular information from defects and particles on the micron scale. TOF-SIMS can also be used for depth profiling and compliments dynamic SIMS. The advantages for TOF-SIMS for profiling are its small areas capabilities and also its ability to do survey depth profiles.
We use TOF-SIMS to assist customers with quality control, failure analysis, troubleshooting, process monitoring, and research and development. For example, the information we provide when investigating wafer surface contamination issues can help determine the specific source of the problem, such as pump oils or component outgassing, or it may indicate problems with the wafer-processing step itself (e.g. etch residue). We also make sure you have person-to-person service throughout the process, so that you understand the test results and their implications.

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X-Ray Diffraction (XRD)

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X-ray diffraction (XRD) is a powerful nondestructive technique for characterizing crystalline materials. It provides information on structures, phases, preferred crystal orientations (texture), and other structural parameters, such as average grain size, crystallinity, strain, and crystal defects. X-ray diffraction peaks are... Show more »

X-ray diffraction (XRD) is a powerful nondestructive technique for characterizing crystalline materials. It provides information on structures, phases, preferred crystal orientations (texture), and other structural parameters, such as average grain size, crystallinity, strain, and crystal defects. X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of x-rays scattered at specific angles from each set of lattice planes in a sample. The peak intensities are determined by the distribution of atoms within the lattice. Consequently, the x-ray diffraction pattern is the fingerprint of periodic atomic arrangements in a given material. A search of the ICDD standard database of x-ray diffraction patterns enables quick phase identification for a large variety of crystalline samples.
We have multiple XRD systems equipped with optical modules that can be exchanged, depending on the analysis requirement, without affecting the accuracy of positioning. It is simple to change between line and point focus of the x-ray tube, enabling simple switching from a regular XRD configuration to a high-resolution XRD configuration. Different combinations of optical modules enable the analysis of powders, coatings, thin films, slurries, fabricated parts, or epitaxial films.

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XRF

X-Ray Fluorescence
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X-ray Fluorescence (XRF) is a non-destructive technique that is used to quantify the elemental composition of solid and liquid samples. X-rays are used to excite atoms in the sample, causing them to emit x-rays with energies characteristic of each element present. The intensity and energy of these x-rays are then measured.
XRF is... Show more »

X-ray Fluorescence (XRF) is a non-destructive technique that is used to quantify the elemental composition of solid and liquid samples. X-rays are used to excite atoms in the sample, causing them to emit x-rays with energies characteristic of each element present. The intensity and energy of these x-rays are then measured.
XRF is capable of detecting elements from Be-U in concentrations from the PPM range to 100%. Because X-rays are used to excite the sample, depths as great as 10µm (or further) can be analyzed. Through the use of appropriate reference standards, XRF analysis can accurately quantify the elemental composition of both solid and liquid samples.
Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.

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Bioanalytical Analysis LC/MS/MS

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Bar Coding

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X-ray Photoelectron Spectrometry

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X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively,... Show more »

X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth. XPS is an elemental analysis technique that is unique in providing chemical state information of the detected elements, such as distinguishing between sulfate and sulfide forms of the element sulfur. The process works by irradiating a sample with monochromatic x-rays, resulting in the emission of photoelectrons whose energies are characteristic of the elements within the sampling volume.
we use XPS/ESCA in a variety of applications to help customers, across a range of industries, with R&D, as well as process development/improvement.

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Assay Development

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Energy Dispersive Spectroscopy

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Energy Dispersive X-ray Spectroscopy (EDS) is a chemical analysis method that can be coupled with the two major electron beam based techniques of Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM).

EDS, when combined with these imaging tools, can... Show more »

Energy Dispersive X-ray Spectroscopy (EDS) is a chemical analysis method that can be coupled with the two major electron beam based techniques of Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM).

EDS, when combined with these imaging tools, can provide spatially resolved elemental analysis from areas as small as 1 nanometer in diameter (STEM). In SEM, the analysis volume is larger and ranges in volume from perhaps 0.1 to 3 microns. The impact of the electron beam on the sample produces x-rays that are characteristic of the elements present on the sample. EDS analysis can be used to determine the elemental composition of individual points, line scans or to map out the lateral distribution of elements from the imaged area.

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Analytical Method Validation

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