Whdsbj1tt4wgbabpncyo 2017 covalent metrology logo thumb

Covalent Metrology Services

Santa Clara, CA, US

Covalent Metrology is dedicated to providing materials innovation companies of all sizes access to high quality metrology, both in-house and externally.  Our Analytical Services business now offers AFM and optical profilometry services with fast turnaround and flat pricing. Our Metrology Partners business engages with clients to solve specific metrology challenges or to upgrade their metrology strategies, tools or practices.  The company is based in Silicon Valley.

Covalent Metrology Services has not listed any services.

X-Ray Diffraction
Price on request

X-ray diffractometry (XRD) is key to determine phases and crystal structure of samples and is a foundational technique for any material development, including advanced materials and thin films. An X-ray beam strikes the sample and the light is diffracted by the crystalline pattern. An interference pattern is then created that is... Show more »

X-ray diffractometry (XRD) is key to determine phases and crystal structure of samples and is a foundational technique for any material development, including advanced materials and thin films. An X-ray beam strikes the sample and the light is diffracted by the crystalline pattern. An interference pattern is then created that is observed by a detector. The pattern observed is specific to each crystalline phase and for a material containing several phases, the patterns add up. This means observing these diffraction patterns gives a fingerprint that can, in theory, be analyzed to reverse-engineer the phases and composition of the sample.

Measurements:
- Identification and quantification of phases
- Crystal structure and orientation
- Lattice spacing
- Stress
- Film thickness

« Show less
Atomic Force Microscopy
Starting at $475.00 per hour

Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface... Show more »

Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable very precise scanning.

« Show less
Ellipsometry
Price on request

Spectral ellipsometry is an advanced technique used to measure thickness, refractive index, extinction coefficient of transparent films. It is based on the change in polarization of light reflected by a film and yields rich data when combined with powerful modeling, a capability Covalent also offers with experts on staff. It is... Show more »

Spectral ellipsometry is an advanced technique used to measure thickness, refractive index, extinction coefficient of transparent films. It is based on the change in polarization of light reflected by a film and yields rich data when combined with powerful modeling, a capability Covalent also offers with experts on staff. It is essential to the development of thin film stacks without having to fabricate cumbersome test structures.

« Show less
UV-Vis-NIR Spectroscopy
Price on request

UV-Visible-NIR spectroscopy is used for determining transparent materials including thin film's optical properties across the whole deep ultraviolet to near infrared spectrum. The instrument gives direct access to transmittance and reflectance (T and R) values, from which the refractive index and extinction coefficient (n and... Show more »

UV-Visible-NIR spectroscopy is used for determining transparent materials including thin film's optical properties across the whole deep ultraviolet to near infrared spectrum. The instrument gives direct access to transmittance and reflectance (T and R) values, from which the refractive index and extinction coefficient (n and k) are calculated. This technique is fast and reliable, and provides valuable data for the assessment of all optical components and coatings used for example in solar cells and displays.

« Show less
Optical Profilometry
Price on request

Covalent’s Optical Profilometer utilizes coherence scanning interferometry (CSI) which refers to a class of optical surface measurement methods wherein the localization of interference fringes during a scan of optical path length provides a means to determine surface characteristics such as topography, transparent film structure,... Show more »

Covalent’s Optical Profilometer utilizes coherence scanning interferometry (CSI) which refers to a class of optical surface measurement methods wherein the localization of interference fringes during a scan of optical path length provides a means to determine surface characteristics such as topography, transparent film structure, and optical properties. CSI is currently the most common interference microscopy technique for areal surface topography measurement by utilizing spectral broadband, white light to achieve interference fringe localization.

« Show less
Spectroscopy
Price on request
Request a quote for more information about this service.
Scanning Probe Microscopy
Price on request
Request a quote for more information about this service.
Microscopy
Price on request
Request a quote for more information about this service.
Spectrophotometry
Price on request
Request a quote for more information about this service.
Imaging & Spectroscopy
Price on request
Request a quote for more information about this service.
AFM services
Atomic Force Microscopy Services
Price on request
Request a quote for more information about this service.
Chemistry and Materials
Price on request
Request a quote for more information about this service.
Material Characterization Services
Price on request
Request a quote for more information about this service.
Fabrication Services
Price on request
Request a quote for more information about this service.
Thin Film Analysis
Price on request
Request a quote for more information about this service.
Optics and Photonics
Price on request
Request a quote for more information about this service.
Engineering & Devices
Price on request
Request a quote for more information about this service.
Analytical Chemistry Services
Price on request
Request a quote for more information about this service.
Ask A Question Find what you're looking for? If not, you can ask this lab a question:
2018-02-12 05:31:30 -0800

Net Promoter Score of 9 received for AFM services.

Additional Ratings: satisfaction with deliverable: 9, satisfaction with timeliness: 9.
2018-01-03 08:27:18 -0800

Net Promoter Score of 9 received for Atomic Force Microscopy.

Additional Ratings: satisfaction with deliverable: 9, satisfaction with timeliness: 9.
2017-12-21 07:51:34 -0800

Net Promoter Score of 9 received for Atomic Force Microscopy.

Additional Ratings: satisfaction with deliverable: 9, satisfaction with timeliness: 9.
2017-12-06 11:28:22 -0800

Net Promoter Score of 9 received for Atomic Force Microscopy.

Additional Ratings: satisfaction with deliverable: 9, satisfaction with timeliness: 9.

Be the first to endorse Covalent Metrology Services

Endorse this lab