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Atomic Force Microscopy

1 Order Completed
Worcester, Massachusetts, US

About Atomic Force Microscopy

Atomic force microscopes (AFMs) belong to a family of instruments known as scanning probe microscopes. They are the principal enabling technology for the interdisciplinary research area known as nanoscience and engineering, or nanotechnology. Their principal use is in mapping the topography of samples at the... Show more ยป

Atomic force microscopes (AFMs) belong to a family of instruments known as scanning probe microscopes. They are the principal enabling technology for the interdisciplinary research area known as nanoscience and engineering, or nanotechnology. Their principal use is in mapping the topography of samples at the micron or sub-micron scale. In advanced modes, they can also be used to map the variation in materials properties (e.g. adhesion, elasticity) across a sample.

Various AFMs are available at Worcester Polytechnic Institute. The choice of AFM is driven by the needs of the project. The equipment is used for the Atomic Force Microscopy courses, undergraduate and graduate research projects, contract research, and AFM service work.

Prof NA Burnham

Google Scholar: https://scholar.google.com/citations?user=j3PncjEAAAAJ&hl=en
YouTube site: https://www.youtube.com/user/AtomicForceMicro
Physics Faculty page: https://www.wpi.edu/people/faculty/nab

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Our Services (8)


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Atomic Force Microscopy (AFM) Services

Starting at $125.00 per hour
  • Topographic imaging (both contact-mode and dynamic-mode),
  • Scan ranges up to 90 um, Z-height up to 40 um,
  • Image processing of the raw topographic data,
  • Air or liquid environments,
  • Materials contrast in dynamic-mode images,
  • Relative adhesion measurements,
  • More advanced modes possible upon discussion,
  • Typical introductory pricing for industry is $500 for a half day.
  • Topographic imaging (both contact-mode and dynamic-mode),
  • Scan ranges up to 90 um, Z-height up to 40 um,
  • Image processing of the raw topographic data,
  • Air or liquid environments,
  • Materials contrast in dynamic-mode images,
  • Relative adhesion measurements,
  • More advanced modes possible upon discussion,
  • Typical introductory pricing for industry is $500 for a half day.
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Scanning Probe Microscopy

Price on request
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Single Cell Force Spectroscopy

Price on request
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Nano-Imaging

Price on request
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AFM Force Spectroscopy

Price on request
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Advanced AFM Imaging

Price on request
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Medium Level AFM Imaging

Price on request
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Basic AFM Imaging

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NB

Nancy Burnham

Associate Professor of Physics and Biomedical Engineering

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