Atomic force microscopes (AFMs) belong to a family of instruments known as scanning probe microscopes. They are the principal enabling technology for the interdisciplinary research area known as nanoscience and engineering, or nanotechnology. Their principal use is in mapping the topography of samples at the micron or sub-micron scale. In advanced modes, they can also be used to map the variation in materials properties (e.g. adhesion, elasticity) across a sample.
Various AFMs are available at Worcester Polytechnic Institute. The choice of AFM is driven by the needs of the project. The equipment is used for the Atomic Force Microscopy courses, undergraduate and graduate research projects, contract research, and AFM service work.
Prof NA Burnham
Google Scholar: https://scholar.google.com/citations?user=j3PncjEAAAAJ&hl=en
YouTube site: https://www.youtube.com/user/AtomicForceMicro
Physics Faculty page: https://www.wpi.edu/people/faculty/nab
Atomic Force Microscopy has not received any reviews.
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