Vkkdqaczteiynhxckabg untitled

Advanced Surface Microscopy, Inc.

Indianapolis, Indiana, US

Atomic Force Microscopy (AFM) is an important analytical tool in science and industry. It's one of the key metrology (measurement) tools used in Nanotechnology, in the semiconductor industry, in optical discs (CD, DVD, Blu-Ray, etc.), in magnetic media, and in many other fields. AFM is used to analyze surface finishes and roughness, material wear, corrosion, and other surface structures. It can be used to map material domains in polymers, crystal structures in metals, particle size and distribution, formed micro and nano-structures, structure and size of catalyst and other powders, fibers of all types, pharmaceutical materials, and many other things. We've analyzed everything from the microroughness of superpolished optics to atomic steps on semiconductor wafers, from DNA molecules to polymer blends used in food packaging, from the sharpness of razor blades to wear patterns on piston rings and the shape of... Show more »

Atomic Force Microscopy (AFM) is an important analytical tool in science and industry. It's one of the key metrology (measurement) tools used in Nanotechnology, in the semiconductor industry, in optical discs (CD, DVD, Blu-Ray, etc.), in magnetic media, and in many other fields. AFM is used to analyze surface finishes and roughness, material wear, corrosion, and other surface structures. It can be used to map material domains in polymers, crystal structures in metals, particle size and distribution, formed micro and nano-structures, structure and size of catalyst and other powders, fibers of all types, pharmaceutical materials, and many other things. We've analyzed everything from the microroughness of superpolished optics to atomic steps on semiconductor wafers, from DNA molecules to polymer blends used in food packaging, from the sharpness of razor blades to wear patterns on piston rings and the shape of liquid droplets, from the size of nanomedicines to the track pitch variation of Blu-Ray discs.

Any surface you can touch is a potential object for study

Techniques we have available include TappingMode height and phase imaging, Scanning Tunneling Microscopy (STM), Nano indenting and scratching, Electric and Magnetic Force Microscopy (EFM and MFM), Scanning Kelvin Probe Microscopy (Surface Potential), Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance Microscopy (SSRM) and other conductive AFM techniques. We use the NanoScope (DI/Veeco/Bruker) Dimension 3100 AFM, which easily accomodates large samples.

Whether you need analysis, consultation or training to use your AFM equipment better, supplies and accessories, traceable calibration standards, NanoScope equipment or equipment repairs, contact us. We can help.

« Show less

Advanced Surface Microscopy, Inc. has not listed any services.

Ask A Question Find what you're looking for? If not, you can ask this lab a question:
Scanning Tunneling Microscopy
Price on request

The Scanning Tunneling Microscope originally gained attention as a simple device for imaging atoms. From that exotic beginning, there has grown a family of Scanning Probe Microscopes, of which the Atomic Force Microscope (AFM) is the most common. Various versions of these instruments operate in air, in liquid, and in vacuum. ... Show more »

The Scanning Tunneling Microscope originally gained attention as a simple device for imaging atoms. From that exotic beginning, there has grown a family of Scanning Probe Microscopes, of which the Atomic Force Microscope (AFM) is the most common. Various versions of these instruments operate in air, in liquid, and in vacuum. They record 3-dimensional topography, magnetic and electric fields, friction, adhesion, stiffness, optical spectra, and more.

Composite surfaces of industrial interest may be created either deliberately (examples include: microfabrication of thin-film recording heads and polymer processing) or accidentally (contaminants on or defects in the surface). TappingModeTM/Phase images can map the material domains with spatial resolution down to 10 nm. Such images can be a powerful aid in process control.

Scanning Probe Microscopy for Materials Analysis in Industry

The Scanning Tunneling Microscope originally gained attention as a simple device for imaging atoms. From that exotic beginning, there has grown a family of Scanning Probe Microscopes, of which the Atomic Force Microscope (AFM) is the most common. Various versions of these instruments operate in air, in liquid, and in vacuum. They record 3-dimensional topography, magnetic and electric fields, friction, adhesion, stiffness, optical spectra, and more.

STM Image of Carbon Atoms in surface of Highly Ordered Pyrolitic Graphite (HOPG)
STM image of Atoms on HOPG
(Highly Ordered Pyrolitic Graphite)

3D perspective view of AFM image of bumps on a nickel CD Stamper
3D representation of AFM image
of Nickel CD Stamper

[Magnetic Force Microscopy (MFM) image of data marks on a computer hard disk]
Magnetic Force Microscopy (MFM)
image of data on a magnetic hard disk.

AFM image of DNA Plasmid on freshly cleaved Mica.
AFM image of DNA Plasmid on Mica

Composite surfaces of industrial interest may be created either deliberately (examples include: microfabrication of thin-film recording heads and polymer processing) or accidentally (contaminants on or defects in the surface). TappingModeTM/Phase images can map the material domains with spatial resolution down to 10 nm. Such images can be a powerful aid in process control.

Phase imaging of the inner surface of an aluminum beverage can reveals differences in the polymer coating.
TappingMode Height and Phase Image of Polymer
Coating on the inner surface of an Aluminum
beverage can. The dark and light regions in the
phase image (Right) reveal different material
domains.

Phase images show the mechanical phase of the tapping tip relative to the drive signal which oscillates the cantilever. The phase image supplements the ordinary height image and often provides unique contrast related to material differences in stiffness and adhesion.

Nano-indentation and Nano-scratching have been developed to provide further information about stiffness and wear resistence with high sensitivity and spatial resolution.

In addition, with proper calibration specimens and our calibration correction software, standard, general use, AFM's can make accurate and highly precise measurements.

« Show less
Atomic Force Microscopy
Price on request

The Atomic Force Microscope (AFM) is being used to solve processing and materials problems in a wide range of technologies affecting the electronics, telecommunications, biomedical, chemical, automotive, aerospace, and energy industries. The materials under investigation include thin and thick film coatings, ceramics, composites,... Show more »

The Atomic Force Microscope (AFM) is being used to solve processing and materials problems in a wide range of technologies affecting the electronics, telecommunications, biomedical, chemical, automotive, aerospace, and energy industries. The materials under investigation include thin and thick film coatings, ceramics, composites, glasses, synthetic and biological membranes, metals, polymers, and semiconductors. The AFM is being applied to studies of phenomena such as abrasion, adhesion, cleaning, corrosion, etching, friction, lubrication, plating, and polishing. The real-world examples presented on our web page indicate the breadth of AFM applications for problem solving; yet they represent only a fraction of our experience at Advanced Surface Microscopy.

Technical Capabilities

AFM images show critical information about surface features with unprecedented clarity. The AFM can examine any rigid surface, either in air or with the specimen immersed in a liquid. "Minor" (and major) differences between "smooth" surfaces are shown dramatically. On one hand, the AFM can resolve very tiny features, even single atoms, that were previously unseen. On the other hand, the AFM can examine a field of view larger than 75 microns (0.003 inch), so that you can make comparisons with other information, e.g. features seen in the light microscope or hazes seen by eye. The AFM can also examine rough surfaces, since its vertical range is more than 5 microns. Our analytical reports of AFM results include three-dimensional images and quantitative data analysis (such as feature sizes, surface roughness and area, and cross-section plots), integrated and interpreted in the context of your problem.

Large samples fit directly in the microscope without cutting. We can examine any area on flat specimens up to 8" (20 cm) in diameter and up to 0.5" (12.7 mm) thick. We have designed custom adapters to accommodate SEM stubs, microtomed blocks, metallurgical mounts, and other odd shapes and sizes (up to 1.5" thick and 42" wide). We can quickly find and document the location of interest using the built-in optical microscope (with magnification up to 2000x). For comparative studies using different probes and scanning modes, we can find the spot within one micron.

« Show less
Microscopy maintenance
Price on request

Atomic Force Profiler (AFP), Automated AFM, and Metrology Repairs:

We provide comprehensive expertise and services for the Vx200 and Vx300 series AFM's, UVx, Dimension 9000 and 7000, and Dimension 3100 and 5000 that use the Veeco Metrology scan head.

Although OEM support has been reduced or eliminated for this “legacy”... Show more »

Atomic Force Profiler (AFP), Automated AFM, and Metrology Repairs:

We provide comprehensive expertise and services for the Vx200 and Vx300 series AFM's, UVx, Dimension 9000 and 7000, and Dimension 3100 and 5000 that use the Veeco Metrology scan head.

Although OEM support has been reduced or eliminated for this “legacy” equipment, we can keep you running. We repair:
- Metrology Scanners, including model DAFMET scan head (manual and TipX versions).
- Metrology controllers, including models NanoScope IIIm (3M) and Dimension 9000/9300 Microscope.
- automated AFM stage equipment.

Additional services:
- PC upgrade
- Preventive maintenance
- Equipment Optimization programs for improved uptime.
- Spare parts supply.
- Training
- Applications support
- Consumable Supplies: cost effective AFM probes matched to your Materials and Device Measurement Requirements.

ASM’s extensive parts inventory for NanoScope brand automated metrology AFM's includes many used and refurbished scanners, electronics, and related items. We can supply these parts anywhere in the world with quick lead times. These parts are tested at our in-house facility in Indianapolis and can be offered with warranty where required.

AFM and STM Repair Service
Price on request
Repair your NanoScope AFM or STM
We can perform many repairs and upgrades on older NanoScope Brand Atomic Force Microscopes.

Is your older NanoScope brand microscope no longer working? We can help.
Many older microscopes are no longer supported by the manufacturer, or the support they offer is an expensive upgrade that you don't need for your particular application.

We have the experience and expertise to perform many repairs and upgrades on existing NanoScope equipment. We also have a large supply of parts, including parts no longer supplied by the manufacturer.

Examples of repairs we have made include:
- NanoScope E controller
- NanoScope III Controller
- Nanoscope IIIa Controller
- NanoScope IV Controller
- NanoScope IVa Controller
- MultiMode AFM Base electronics, including upgrade to Phase Imaging.
- Dimension Base Electronics (Backboard/E-Box) including upgrade to phase.
- Electronics Extender Module (Phase Box)
- AFM PC - interface, DSP, and DSI boards
- AFM PC Upgrade.
- Electrochemical STM (model ECM) base electronics.
- Reduction in Z drift in Dimension AFMs so that your scans don’t go out of range.

We have an extensive inventory of repair parts.

« Show less
Scanning Probe Microscopy
Price on request
Request a quote for more information about this service.
Microscopy
Price on request
Request a quote for more information about this service.
Equipment
Price on request
Request a quote for more information about this service.
Imaging & Spectroscopy
Price on request
Request a quote for more information about this service.
Equipment Support
Price on request
Request a quote for more information about this service.
Equipment Maintenance
Price on request
Request a quote for more information about this service.
AFM services
Atomic Force Microscopy Services
Price on request
Request a quote for more information about this service.

Advanced Surface Microscopy, Inc. has not received any ratings.

Be the first to endorse Advanced Surface Microscopy, Inc.

Endorse this lab